Withdrawn
Draft standard
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DIN IEC 47(CO)1251:1992-05
Semiconductor devices; measuring method of the excess carrier effective life time of diodes for fast switching applications; identical with IEC 47(Central Office)1251
Summary
Halbleiterbauelemente; Meßverfahren für die effektive Lebensdauer überschüssiger Ladungsträger in schnellen Schaltdioden; Identisch mit IEC 47(CO)1251
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 05/01/1992 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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