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DIN IEC 47(CO)1261:1992-08

Semiconductor devices; measuring methods for GaAs field-effect transistors used in microwave applications; identical with IEC 47(Central office)1261

Summary

Halbleiterbauelemente - Messverfahren für GaAs Feldeffektransistoren für Mikrowellenanwendungen; Identisch mit IEC 47(CO)1261

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 08/01/1992
Page Count 8
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ISBN ---
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