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DIN IEC 47(Sec)1234:1992-04
Semiconductor devices; destructive test; term and definition; identical with IEC 47(Secretariat)1234
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Summary
Halbleiterbauelemente - Zerstörende Prüfung - Begriff; Identisch mit IEC 47(Sec)1234
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/1992 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/04/1992
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