Superseded Draft standard
Historical

DIN IEC 47(Sec)1319:1993-10

Semiconductor devices; measuring the turn-off behaviour of GTO-thyristors (IEC 47(Secretariat)1319:1993)

Summary

Halbleiterbauelemente; Meßverfahren für das Abschaltverhalten von GTO-Thyristoren (IEC 47(Sec)1319:1993)

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 10/01/1993
Page Count 8
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