Superseded
Draft standard
Historical
DIN IEC 47(Sec)1322:1994-04
Semiconductor devices; measuring methods for thyristors; revision of IEC 747-6, chapter IV (IEC 47(Secretariat)1322:1993)
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Summary
Halbleiterbauelemente; Meßverfahren für Thyristoren; Überarbeitung der IEC 747-6, Kapitel IV (IEC 47(Sec)1322:1993)
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/1994 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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