DIN IEC 47E(Sec)4:1994-04
Withdrawn Draft standard
Most Recent

DIN IEC 47E(Sec)4:1994-04

Semiconductor devices; revised and additional measuring methods for microwave field effect transistors; amendment to IEC 47(Central Office)1261 (IEC 47E(Secretariat)4:1993)

Summary

Halbleiterbauelemente - Zusätzliche und überarbeitete Messverfahren für Mikrowellen-Feldeffekt-Transistoren; Ergänzung zu IEC 47(CO)1261 (IEC 47E(Sec)4:1993)

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 04/01/1994
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us