Superseded
Standard
Historical
DIN IEC 60749:1987-09
Semiconductor devices; mechanical and climatic test methods; identical with IEC 60749, edition 1984
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Summary
Halbleiterbauelemente; Mechanische und klimatische Prüfverfahren; Identisch mit IEC 60749, Ausgabe 1984
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/1987 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/09/1987
Superseded
Historical