Superseded
Draft standard
Historical
DIN IEC 60749-24:2002-11
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance; Unbiased HAST (IEC 47/1646/CD:2002)
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Summary
The unbiased HAST is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 11/01/2002 |
| Cancellation Date | 09/01/2004 |
| Page Count | 0 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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