Superseded
Draft standard
Historical
DIN IEC 60749-34:2003-01
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power Cycling (IEC 47/1648/CD:2002)
Preview
Summary
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34: Lastwechselprüfung (IEC 47/1648/CD:2002)
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/2003 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/01/2003
Superseded
Historical