Superseded Draft standard
Historical

DIN IEC 62276:2009-10

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/879/CD:2009)

Summary

Einkristall-Wafer für Oberflächenwellen-(OFW-)Bauelemente - Festlegungen und Messverfahren (IEC 49/879/CD:2009)

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 10/01/2009
Page Count 8
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