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DIN IEC/TR 62878-2-2*DIN SPEC 42878-2-2:2014-04
Device embedded substrate - Guidelines - Electrical testing (IEC 91/1138A/CD:2013)
Summary
The purpose of this technical report is to provide users the necessary information on the electrical testing of device embedded substrates, in specific interconnection open/short test as well as device functional test.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/2014 |
| Page Count | 21 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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01/04/2014
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