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DIN IEC/TR 62878-2-2*DIN SPEC 42878-2-2:2014-04

Device embedded substrate - Guidelines - Electrical testing (IEC 91/1138A/CD:2013)

Summary

The purpose of this technical report is to provide users the necessary information on the electrical testing of device embedded substrates, in specific interconnection open/short test as well as device functional test.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 04/01/2014
Page Count 21
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ISBN ---
Weight (in grams) ---
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