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DIN V 32879-1:1995-03
Optoelectronic measurement of distance using time-of-flight principle - Part 1: Incoherent time-of-flight principle
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Summary
Optoelektronische Abstandsmessung nach dem Laufzeitverfahren - Teil 1: Inkohärente Laufzeitverfahren
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 03/01/1995 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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