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IEC 60512-25-3:2001
IEC 60512-25-3:2001 Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation
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Summary
Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 07/26/2001 |
| Edition | 1.0 |
| Page Count | 23 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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