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IEC 60748-11-1:1992
IEC 60748-11-1:1992 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
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Summary
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/01/1992 |
| Edition | 1.0 |
| Page Count | 71 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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