IEC 60749-27:2006/AMD1:2012
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IEC 60749-27:2006/AMD1:2012

IEC 60749-27:2006/AMD1:2012 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
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Publisher International Electrotechnical Commission (IEC)
Publication Date 09/25/2012
Edition 2.0
Page Count 5
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Weight (in grams) ---

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