Superseded
Standard amendment
Historical
IEC 60749-30:2005/AMD1:2011
IEC 60749-30:2005/AMD1:2011 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
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Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/25/2011 |
| Edition | 1.0 |
| Page Count | 9 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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