IEC 60749-41:2020
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IEC 60749-41:2020

IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Summary

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 07/22/2020
Edition 1.0
Page Count 44
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Weight (in grams) ---
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