IEC 60749-43:2017
Superseded Standard
Historical

IEC 60749-43:2017

IEC 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

Summary

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 06/15/2017
Edition 1.0
Page Count 74
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us