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IEC 61580:1995
IEC 61580:1995 Measurement of return loss on waveguide and waveguide assemblies
Summary
Describes the sweep frequency method used for the measurement of return loss on waveguide and waveguide assemblies. The contents of the corrigendum of July 2006 have been included in this copy.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 11/22/1995 |
| Edition | 1.0 |
| Page Count | 11 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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22/11/1995
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