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IEC 61580-9:1996
IEC 61580-9:1996 Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
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Summary
Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 07/03/1996 |
| Edition | 1.0 |
| Page Count | 15 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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