IEC 61788-15:2011
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IEC 61788-15:2011

IEC 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies

Summary

IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 10/24/2011
Edition 1.0
Page Count 96
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