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IEC 61788-24:2018
IEC 61788-24:2018 Superconductivity - Part 24: Critical current measurement - Retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires
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Summary
IEC 61788-24:2018 describes a test method for determining the retained critical current after double bending at room temperature of short and straight Ag- and/or Ag alloy-sheathed Bi-2223 superconducting wires that have the shape of a flat or square tape containing mono- or multicores of oxides. The wires can be laminated with copper alloy, stainless steel or Ni alloy tapes.
The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.
The test method is intended for use with superconductors that have a critical current less than 300 A and an n-value larger than 5.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 06/18/2018 |
| Edition | 1.0 |
| Page Count | 58 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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