Superseded
Standard
Historical
IEC 61967-4:2002
IEC 61967-4:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
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Summary
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
Notes
Ce document et ses amendements séparés resteront valables en parallèle avec la version groupée*Amendement prévu par IEC 47A/693/CDV (2004-02), IEC 47A/735/FDIS (2005-09).
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/30/2002 |
| Edition | 1.0 |
| Page Count | 57 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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