IEC 62047-18:2013
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IEC 62047-18:2013

IEC 62047-18:2013 Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials

Summary

IEC 62047-18:2013 specifies the method for bend testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 micrometre and 10 micrometre. This International Standard specifies the bend testing and test piece shape for micro-sized smooth cantilever type test pieces, which enables a guarantee of accuracy corresponding to the special features.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 07/17/2013
Edition 1.0
Page Count 26
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Weight (in grams) ---
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