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IEC 62374:2007
IEC 62374:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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Summary
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 03/29/2007 |
| Edition | 1.0 |
| Page Count | 43 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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