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IEC 62415:2010
IEC 62415:2010 Semiconductor devices - Constant current electromigration test
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Summary
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/19/2010 |
| Edition | 1.0 |
| Page Count | 22 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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19/05/2010
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