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IEC 62416:2010
IEC 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
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Summary
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 04/26/2010 |
| Edition | 1.0 |
| Page Count | 20 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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26/04/2010
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