IEC 62951-2:2019
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IEC 62951-2:2019

IEC 62951-2:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices

Summary

IEC 62951-2:2019 specifies terms, definitions, symbols, configurations and evaluation methods that can be used to evaluate and determine the performance characteristics of flexible thin-film transistor (TFT) devices. This document specifies test methods and characteristic parameters for accurately evaluating the performance and reliability in practical use of flexible TFT devices under the bending status.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 04/17/2019
Edition 1.0
Page Count 21
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ISBN ---
Weight (in grams) ---
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