IEC 62951-6:2019
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IEC 62951-6:2019

IEC 62951-6:2019 Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

Summary

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 05/06/2019
Edition 1.0
Page Count 50
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ISBN ---
Weight (in grams) ---
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