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IEC 62969-4:2018

IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

Summary

IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 06/18/2018
Edition 1.0
Page Count 39
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