IEC 63287-2:2023
Active Standard
Most Recent

IEC 63287-2:2023

IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

Summary

IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 03/29/2023
Edition 1.0
Page Count 30
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us