IEC TR 62878-2-2:2015
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IEC TR 62878-2-2:2015

IEC TR 62878-2-2:2015 Device embedded substrate - Part 2-2: Guidelines - Electrical testing

Summary

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 12/04/2015
Edition 1.0
Page Count 29
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Weight (in grams) ---
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