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IEC TS 61945:2000
IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis
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Summary
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 03/10/2000 |
| Edition | 1.0 |
| Page Count | 23 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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