ISO 11505:2012 (R2018)
Superseded , Reaffirmed , Under review Standard
Historical

ISO 11505:2012 (R2018)

Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Most recent standard
Draft standard

Summary

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

Notes

90.92 : Norme internationale à réviser

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 12/12/2012
Confirmation Date 03/09/2018
Edition 1
Page Count 33
EAN ---
ISBN ---
Weight (in grams) ---
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