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ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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Summary
This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
Notes
60.60 : Norme internationale publiée
Technical characteristics
| Publisher | International Organization for Standardization (ISO) |
| Publication Date | 01/29/2020 |
| Edition | 1 |
| Page Count | 17 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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