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ISO 17297:2025
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
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Summary
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
Notes
60.60 : Norme internationale publiée
Technical characteristics
| Publisher | International Organization for Standardization (ISO) |
| Publication Date | 05/26/2025 |
| Edition | 1 |
| Page Count | 14 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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26/05/2025
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