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NBN EN 12698-2:2007
Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
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Summary
This standard describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.
It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN, and SiAlON are described.
NOTE For the refinement procedures the total nitrogen content, analysed in accordance with EN 12698-1 is needed.
It includes details of sample preparation and general principles for qualitative and quantitative analysis of mineralogical phase composition. Quantitative determination of ?-Si3N4, ?-Si3N4, Si2ON2, AlN, and SiAlON are described.
NOTE For the refinement procedures the total nitrogen content, analysed in accordance with EN 12698-1 is needed.
Technical characteristics
| Publisher | Bureau de Normalisation Belge (NBN) |
| Publication Date | 06/19/2007 |
| Cancellation Date | 09/30/2007 |
| Page Count | 17 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
19/06/2007
Withdrawn
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