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PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific and recommendations Test quality
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Summary
Quality assurance;Electronic equipment and components;Coded representation;Approval testing;Semiconductors;Integrated circuits;Product information;Information exchange;Conformity;Data;Quality control;Quality;Data representation
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/15/2001 |
| Page Count | 14 |
| Themes | Data representation |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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15/03/2001
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