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PD IEC TS 62607-8-1:2020
Nanomanufacturing. Key control characteristics Nano-enabled metal-oxide interfacial devices. Test method for defect states by thermally stimulated current
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Summary
Nanomaterials;Characteristics;Data analysis;Interfacial tension;Metal oxide semiconductors
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/27/2020 |
| Page Count | 32 |
| Themes | Metal oxide semiconductors |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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