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PD IEC TS 62607-8-3:2023
Nanomanufacturing. Key Control Characteristics Nano-enabled metal-oxide interfacial devices. Analogue resistance change and fluctuation: Electrical measurement
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Summary
Nanomaterials;Metal oxide semiconductors;Interfacial tension;Electrical resistance;Analogue integrated circuits;Electronic devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/08/2023 |
| Page Count | 22 |
| Themes | Electronic devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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