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PD IEC TS 62607-9-1:2021

Nanomanufacturing. Key control characteristics Traceable spatially resolved nano-scale stray magnetic field measurements. Magnetic force microscopy

Summary

Nanotechnology;Field effects (magnetic);Field strength (magnetic);Magnetic fields;Slides (microscopy)

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 11/22/2022
Page Count 66
Themes Slides (microscopy)
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