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PD ISO/TR 19319:2013

Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods

Summary

Auger electron spectroscopy;Surface chemistry;Electron emission;Photoelectron spectroscopy;Chemical analysis and testing;Spectroscopy;Resolution;Area;Surfaces;Chemical composition;X-ray photoelectron spectroscopy

Technical characteristics

Publisher British Standards Institution (BSI)
Publication Date 03/31/2013
Page Count 126
Themes X-ray photoelectron spectroscopy
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