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PD ISO/TR 22335:2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
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Summary
Chemical analysis and testing;X-ray fluorescence spectrometry;Profilometers;Depth;Surface chemistry;Profile measurement;Surface properties;Spectroscopy;Spectrochemical analysis;Electron beams;X-ray analysis
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/31/2007 |
| Page Count | 28 |
| Themes | X-ray analysis |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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