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UNE-EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
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Technical characteristics
| Publisher | Asociacion Espanola de Normalizacion y Certificacion (AENOR) |
| Publication Date | 11/21/2003 |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |