UNE-EN 60749-18:2003
Superseded Standard
Historical

UNE-EN 60749-18:2003

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
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Technical characteristics

Publisher Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Publication Date 11/21/2003
Cancellation Date 05/16/2022
Page Count 16
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ISBN ---
Weight (in grams) ---
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