Superseded
Standard
Historical
UNE-EN 60749-20:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
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Technical characteristics
| Publisher | Asociacion Espanola de Normalizacion y Certificacion (AENOR) |
| Publication Date | 06/11/2004 |
| Cancellation Date | 09/02/2012 |
| Page Count | 28 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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