UNE-EN 60749:2000
Superseded Standard
Historical

UNE-EN 60749:2000

Semiconductor devices - Mechanical and climatic test methods
Base standard
Most recent standard
No description.

Technical characteristics

Publisher Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Publication Date 11/15/2000
Cancellation Date 10/01/2005
Page Count 52
EAN ---
ISBN ---
Weight (in grams) ---

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