UNE-EN 60749-23:2005
Active , Modified Standard
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UNE-EN 60749-23:2005

Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Base standard
Most recent standard
No description.

Technical characteristics

Publisher Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Publication Date 03/16/2005
Page Count 12
EAN ---
ISBN ---
Weight (in grams) ---

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