UNE-EN 60749-29:2004
Superseded Standard
Historical

UNE-EN 60749-29:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
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Publisher Asociacion Espanola de Normalizacion y Certificacion (AENOR)
Publication Date 07/09/2004
Cancellation Date 07/10/2014
Page Count 22
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