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UNE-EN 60749-33:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 33: Accelerated moisture resistance - Unbiased autoclave
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Technical characteristics
| Publisher | Asociacion Espanola de Normalizacion y Certificacion (AENOR) |
| Publication Date | 03/16/2005 |
| Page Count | 10 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |